Device, method and system for measuring the distribution of selected properties in a material

ABSTRACT

A device for measuring a distribution of selected properties of a material. The device includes an emitter configured to emit electromagnetic radiation at at least a first and second frequency in a selected frequency range through the material, at least one sensor configured to detect electromagnetic radiation transmitted through the material, and an analyzer configured to determine the distribution of selected properties based on the detected electromagnetic radiation at the at least first and second frequency. Further, the distribution of the selected properties is unchanged between the emitted electromagnetic radiation at the first and second frequencies.

CROSS-REFERENCE TO RELATED APPLICATION

The present application is a continuation of U.S. application Ser. No.09/885,285, filed Dec. 4, 2000. Application Ser. No. 09/885,285 claimedpriority to Sweden Application No. 0003078-3, filed Aug. 31, 2000.Priority of U.S. application Ser. No. 09/885,285 and Sweden ApplicationNo. 0003078-3 is claimed under 35 U.S.C. § 120/119(e).

FIELD OF INVENTION

This invention relates to a device for measuring the distribution ofselected properties in a material, and in particular a device thatnon-contacting and non-destructively measures the spatial distributionof material properties, such as density, water contents and temperatureof materials, by detecting electromagnetic radiation. The invention alsorelates to a method and a system.

BACKGROUND OF THE INVENTION

Many industrial processes depend on the measurement of materialproperties as temperature, water contents and material density. A closemonitoring of these material properties results often in increasedefficiency and improved product quality. Additional benefits are likelyto occur, if such measurements can be accomplished fast and in anon-destructive, non-invasive, and non-contacting way with acceptableaccuracy.

As an example the determination of the temperature distribution infoodstuff during heating process. Here, an on-line monitoring of thetemperature distribution helps to avoid cold spots where bacteria arenot eliminated completely or to reduce the overdue heating time spent toensure complete bacteria elimination. This results in a reduced heatingtime and reduced energy consumption as well as in an increasedthroughput of the production line.

Material properties are traditionally measured by some form ofdestruction (sample separation, peeking) but can often be measured bythe analysis of transmitted electromagnetic radiation by evaluating thedielectric response of the material. Measurements using electromagneticradiation are generally contact-free and non-destructive.

A suitable frequency region of electromagnetic radiation to determinematerial properties as temperature distribution, water contents anddensity is the lower microwave region where water absorption is not toolarge and the wavelength is already short enough to ensure reasonablespatial resolution. The determination of the above material propertiesis achieved by analysing the dielectric response of the material basedon the material's polarisability. Dielectric data of a material sampleare typically obtained in analysing the electromagnetic wave'sreflection and transmission properties or a combination of both. Inorder to obtain a distribution of the material properties, athree-dimensional image of the material's dielectric response must bemeasured. This requires to move the microwave detector setup and thematerial sample relative to each other.

Prior art instruments make use of either a single measurement frequencyor the emission frequency is swept within a frequency interval (FMCW)and the average delay time is calculated from the obtained data.

Prior art that approaches to dielectric imaging, use the transmission ofelectromagnetic radiation of a single frequency (or a small band)between a multitude of antenna locations or the material sample isshifted and rotated or shifted in two dimensions in order to obtain aspatial resolution. Based on these data the dielectric image is obtainede.g. by the well-known CSI (contrast source iteration) method where thelocation and strength of polarisation sources are obtained in aniterative process.

Using techniques well-known to a skilled person (i.e. Contrast SourceIteration CSI, as described below) the electromagnetic picture is usedto calculate the unknown dielectric functions in the dielectric picture.

Starting from Maxwell's Equations (as described by R. F. Harrington, inthe book with the title “Time Harmonic Electromagnetic Fields”,published by Mc. Graw Hill 1961) one assumes that any region where thedielectric function is different from unity, the electromagnetic fieldcreates bound charges due to polarisation. These bound charges arecreated by the electric field itself and they oscillate with itresulting in an additional current component:j(p)=ε(p)·u(p)

where the current density is j, the electric field is u and thedielectric function of the material is ε and of the background isdenoted ε_(b·). Assume p and q to be two position vectors in a twodimensional cross section of the measurement gap D is a domain whichcontains the cross section of the material sample. The vector q denotesthe source point of the electromagnetic radiation. Based on that ageneral relation for the connection between the electric fields in themeasurement space is obtained formally by applying the definition of aGreen's function for the electric current:u_(j)(p) = k²∫_(D)  G(p, q) ⋅ j(q) ⋅ 𝕕v(q)

Inserting the above current density relation and splitting the integralyields:u_(j)(p) = k²∫_(D)  G(p, q) ⋅ ɛ_(b) ⋅ u(p) ⋅ 𝕕v(q) + k²∫_(D)  G(p, q) ⋅ [ɛ(p) − ɛ_(b)] ⋅ u(p) ⋅ 𝕕v(q)

Here the first term denotes the electric field when the dielectricresponse of the background is present only, the second term stands forthe fields generated by polarisation i.e. a dielectric contrast. Thefields when only a background is presented are referred to as incidentfields u^(inc). Then the field at an observation point incident from theradiation source is (according to an article by P. M. van den Berg, B.J. Kooj, R. E. Kleinman, with the title “Image Reconstruction fromIswich-Data III”, published in IEEE Antenna and Propagation Magazine,Vol. 41 No. 2 April 1999, p. 27-32):u_(j)(p) = u_(j)^(inc)(p) + k²  ∫_(D)  G(p, q) ⋅ χ(q) ⋅ u_(j)(q) ⋅ 𝕕v(q)

where G denotes the two-dimensional Green's function of theelectromagnetic problem${G\left( {p,q} \right)} = {\frac{i}{4}{H_{0}^{(1)}\left( {k \cdot {{p - q}}} \right)}}$

and the polarisability function χ depends on the dielectric function ofthe material ε and the background ε_(b·) in the following way:${\chi(p)} = \frac{{ɛ(p)} - ɛ_{b}}{ɛ_{0}}$

Defining scattered fields f one obtains directly: $\begin{matrix}{{F_{j}(r)} = {{u_{j}(r)} - {u_{j}^{inc}(r)}}} \\{\quad{= {k^{2}{\int_{D}^{\quad}{{G\left( {r,q} \right)} \cdot {\chi(q)} \cdot {u_{j}(q)} \cdot {\mathbb{d}{v(q)}}}}}}}\end{matrix}$

From this an integral equation for the scattered electric field at anypoint r is set up.${F_{j}(r)} = {\frac{i}{4}k^{2}{\int_{D}^{\quad}{{H_{0}^{(1)}\left( {k \cdot {{r - q}}} \right)} \cdot {\chi(q)} \cdot \left\lbrack {{F_{j}(q)} + {u_{j}^{inc}(q)}} \right\rbrack \cdot {\mathbb{d}{v(q)}}}}}$

This relation is fulfilled exactly when r is equal to the antennalocation and the F_(i)(r) are measured values of the scattered fieldsfor a given wave vector k for a frequency f:$k = {\frac{2\pi}{c} \cdot {f.}}$The values of F_(i)(r) for the points interior to the region D are onlyfulfilled approximately. So the above relation has to be solved for aset K of k vectors and a set Q of internal points resulting in a[K·Q]×[K·Q] non-linear matrix problem for the fields F_(i)(r) and thepolarisabilities χ(r).

In matrix form the state equation becomes:u=u ^(inc) +Gχu

whereas the frequency relation is:F=Gχu

Introducing the contrast source φ=χ·u the above relations becomeφ=χu^(inc)+χGφ at all Q interior points, for any of the K measurementfrequencies F=Gφ at a single antenna location, for any of the Kmeasurement frequencies.

Using the method of conjugated gradients sequences for the contrasts andthe contrast sources solving the above problem are obtained.

SUMMARY OF THE INVENTION

A device has been designed to measure the spatial distribution of thetemperature, water contents and density distribution in a material basedon the dielectric and magnetic information contained in transmissionmeasurements obtained using microwave radiation.

This invention covers two methods to resolve such information frommeasured data:

-   -   (a) The temperature, density and water contents profile can be        obtained by interpolation between a set of previously measured        material samples where the profiles are known in advance. There        the measurement result is found by a best fit to the        interpolation database.    -   (b) The said profile is found by direct calculation of the        inverse scattering problem resulting in a known distribution of        the dielectric and magnetic properties. Based on models on the        dependence of the dielectric and magnetic properties as        functions of the wanted parameters, a map of the said properties        is obtained directly.

The instrument proposed here may only use one mechanical scanningdimension. Due to the usage of a multi-channel antenna and a multitudeof frequencies, a two-dimensional cross-section of the dielectricpicture is obtained. This calculation process involves a novel methodrelated to contrast source iteration where the location and strength ofpolarisation sources are obtained in an iterative process based ontransmitted electromagnetic field measurements at a multitude offrequencies. Thereby the antenna patterns must be frequency dependentand they are assumed to be directed in cross section of the sampleallowing an essentially two dimensional approach.

In order to facilitate the calculation of the dielectric parameters,regions where the dielectric properties are at first order constant areobtained by an e.g. evaluating video pictures taken from at least twodifferent points of view with overlapping image region. From these videopictures a reasonable guess of the material sample's dielectricstructure is made. As an alternative ultrasound images can be used forthe same purpose or a three dimensional image of the material sample maybe stored in a memory.

The object with the invention is thus to provide a device that measuresthe spatial property distribution in a non-contacting andnon-destructive way.

An advantage of the invention is that it provides on-line fastmeasurements of spatially resolved material parameter distributions bymeans of a combined application of microwave reflection and transmissionmeasurements and a three dimensional contour of the material.

Traditionally the temperature and density of the material samples isobtained by probing a certain fraction of the material samples. Thismethod allows a complete on-line monitoring of all material samples inproduction increasing the degree of product control.

The accuracy of the measurement is checked by means of calibrationsamples with known constituents and known temperature profile which aremeasured at regular intervals. Thereby it is sufficient to performinvasive temperature measurements after the sample has been measured atdifferent points of the sample and compare them to the instrument'sfindings. As a additional verification process the same procedure can berepeated when the sample has e.g. cooled down.

Summarising the advantages of this invention it provides anon-destructive, non-invasive and non-contacting, fast and automaticmeasurement process of the water contents and temperature distributionof dielectric bodies requiring minimal human intervention. Themeasurement process is insensitive to changes in product size, form andpositioning.

Other features of the current invention will become more apparent in thefollowing detailed description of the preferred embodiment which bymeans of example illustrate the principles of this invention.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic diagram of a first embodiment of a deviceaccording to this invention.

FIG. 2 is a chart indicating a dielectric model for chicken anticipatedfor reduction of the amount of unknown variables of the sample'sdielectric behaviour.

FIG. 3 is a chart indicating a dielectric model for bread anticipatedfor reduction of the amount of unknown variables of the sample'sdielectric behaviour.

FIG. 4 illustrate a cross section of a bread loaf, where the dielectricmodel from FIG. 3 is mapped.

FIG. 5 is a schematic chart indicating the evaluation process in orderto obtain moisture, density and temperature data from dielectricproperties.

FIG. 6 is a schematic diagram of a second embodiment of a deviceaccording to this invention.

FIG. 7 is a flow chart of the whole calculation process.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

As shown in FIG. 1 the primary elements of a measurement device 10according to a first embodiment of the present invention are a microwavegenerator 11, a transmitting antenna 12, a receiving antenna 13, ananalyser 14. These elements work together to analyse the distribution ofmaterial properties (such as water contents, density and temperature) ina material sample 16. The sample is carried on a conveyor means 17,which may consist of a slide table mounted on a linear motor, and isarranged in a measurement gap between said transmitting antenna 12 andreceiving antenna 13.

The generator 11 is connected to the transmitting antenna 12 andgenerates electromagnetic radiation, which is transmitted from thetransmitting antenna 12 towards the receiving antenna 13. The materialsample 16 is placed between said transmitting antenna 12 and saidreceiving antenna 13, which indicate that at least a part of thetransmitted radiation passed through the material sample 16. Theelectromagnetic radiation is transmitted in the form of signals 18, eachhaving a first amplitude and phase, and a different frequency within afrequency range.

The generator 11 is also connected to the analyser 14, and informationregarding the amplitude and frequency of each transmitted signal 18 issent to the analyser 14.

The transmitted signals 18 pass, at least partially, through thematerial sample 16 and are received by the receiving antenna 13 asreceiving signals 19 each having a second amplitude and phase, which maybe different from the first amplitude and phase, for each differentfrequency.

The receiving antenna 13 is connected to the analyser 14, which receivesinformation regarding the received signals 19. The analyser 14 comparesthe amplitude and phase of the transmitted signal with the correspondingamplitude and phase for the received signal, for each transmittedfrequency.

Each transmitting antenna 12 is designed to emit electromagneticradiation of a set of selected frequencies partially impinging on andflowing through the material samples 16. Each receiving antenna 13 isdesigned to receive electromagnetic radiation emitted from any transmitantenna 12 and at least partially transmitted and reflected by thematerial sample 16. The receiving antenna 13 may be set up at one ormore positions enabling to scan the material sample 16.

The analyser 14 acts as interface between the raw data and the user. Theoutput of the analyser 14 consists of a three-dimensional picture of thematerial sample's properties as density, water contents and/ortemperature.

Information about the microwave attenuation and runtime (or phase anddamping of the microwave power wave) between the transmitting antennas12 and receiving antennas 13 are calculated in the analyser 14. For eachfrequency of the chosen frequency set and for a chosen set oftransmitting-/receiving antenna pair and at a fixed point on thematerial sample 16 such a calculation is performed.

In this embodiment of the invention it is assumed that the shape of thematerial sample 16 is known, and a three dimensional image of thematerial sample is stored in a memory 15 connected to the analyser 14.The three dimensional image may be used to calculate cross-sectionalimages for each measurement position of the material sample on theconveyor means 17. Examples of a material where the three dimensionalimage is known are fluids passing through the gap in a tube or sampleshaving a defined shape, such as candy bars.

For all measurement positions along the material sample 16, the resultsof the damping and phase measurement, for all frequencies, are used todetermine an electromagnetic picture, which is obvious for a personskilled in the art, and since this is not an essential part of theinvention these steps are not disclosed in this application. Theposition information from the memory is saved as a three dimensionalsurface position data set describing the three dimensional contour ofthe material sample 16.

The material properties (such as water contents, density andtemperature) in a material may be obtained by interpolation of thematerial property distributions in the following.

Assume a set of material samples has been measured previously asreferences. The data sets are stored in their original size or in atransformed form to reduce the data size. For these materials, thedistribution of the parameters to be measured is known. These can bedifferent temperatures, different temperature profiles, differentdensity and water contents distributions. Extracted parameters of themeasurement of these reference products form a point in a highdimensional vector space. To each point in this space a specificdistribution of the parameters to be determined is associated byinterpolation of the adjacent points of the reference measurements. Themeasurement results on an unknown product is now associated with anotherpoint on this vector space. Since the parameter distribution to bemeasured is known for a certain region in the vector space, thedistribution associated with the measured point yields the measurementresult.

On the other hand direct calculation of the material propertydistribution may be applied.

Together with a three dimensional model of the dielectric structure ofthe material sample this three dimensional picture is used to determineregions within the measurement gap where the (yet unknown) dielectricfunction of the material can be assumed non-changing. FIG. 2 illustratesa model for chicken 20 and FIG. 3 illustrates a model for bread 30.

Each model comprises several regions 21, 31, where the dielectricfunction is assumed to be constant. The number of regions in the modelsmay be adjusted, even during the process of obtaining the materialproperties, to obtain a smooth, but not too smooth, curve for thedielectric constant as a function of x and y co-ordinates, ε(x,y).

The regions in FIG. 3 are divided by concentric circles 32 and a numberof mapping points P1-P14 are arranged on the outer concentric circle 33.The distance between each mapping point is preferably essentially equal.

The appropriate model is adapted to the three dimensional image of thesample material, in this example a bread loaf. FIG. 4 illustrates across-section 40 of a three dimensional image of the bread loaf togetherwith an x-axis and an y-axis. The contour of the bread is indicated bythe line 41, which is derived from the three dimensional surfaceposition data set stored in the memory, and the mapping points P1-P14 inFIG. 3 are mapped upon the contour line 41. The concentric circles 32 inFIG. 3 are adjusted after the shape of the contour which is illustratedby the lines 42 in FIG. 4 divides the cross section of the bread loafinto regions 43 where the dielectric constant is assumed constant.

Below is described a simplified approach of CSI, anticipating regionswhere the dielectric function is constant, as indicated in the modelsdescribed in FIGS. 2 and 3.

Starting with the relation between the scattered field at a givenlocation as a function of the contrast source one can simplify thesolution process considerably when the location of regions where thedielectric function is constant are known a priori: $\begin{matrix}{{u_{j}(p)} = {{u_{j}^{inc}(p)} + {k^{2}{\int_{D}^{\quad}{{G\left( {p,q} \right)} \cdot {\chi(q)} \cdot {u_{j}(q)} \cdot {\mathbb{d}{v(q)}}}}}}} \\{{u_{j}(p)} = {{u_{j}^{inc}(p)} + {k^{2}{\int_{D}^{\quad}{{G\left( {p,q} \right)} \cdot {\chi(q)} \cdot {u_{j}(q)} \cdot {\mathbb{d}{v(q)}}}}}}} \\{\quad{= {{u_{j}^{inc}(p)} + {k^{2}{\sum\limits_{n = 1}^{N}{\chi_{n} \cdot {\int_{D_{N}}^{\quad}{{G\left( {p,q} \right)} \cdot {u_{j}(q)} \cdot {\mathbb{d}{v(q)}}}}}}}}}}\end{matrix}$

where G denotes again the two-dimensional Green's function of theelectromagnetic problem${G\left( {p,q} \right)} = {\frac{i}{4}{H_{0}^{(1)}\left( {k \cdot {{p - q}}} \right)}}$

and the polarisability χ_(n) depends on the dielectric function of thematerial ε being constant on the region D_(n) and the background ε_(b·)in the following way: $\chi_{n} = \frac{ɛ_{n} - ɛ_{b}}{ɛ_{0}}$

Obviously the above step reduce the matrix size from the number ofcontrast sources to the number of different regions taken into account.

From the above a similar integral equation for the scattered electricfield at any point r is set up.${F_{j}(r)} = {\frac{i}{4}k^{2}{\sum\limits_{n = 1}^{N}\quad{\chi_{n} \cdot {\int_{D_{n}}{{H_{0}^{(1)}\left( {k \cdot {{r - q}}} \right)} \cdot \quad\left\lbrack {{F_{j}(q)} + {u_{j}^{inc}(q)}} \right\rbrack \cdot {\mathbb{d}{v(q)}}}}}}}$

For this relation a similar solution process as in the general case isapplied:

Below is described a calculation of the dielectric function for one pairof antennas for various frequencies for frequency independentpolarisation.

Starting with the relation between the scattered field at a givenlocation as a function of the contrast source one can simplify thesolution process considerably when the location of regions where thedielectric function is constant are known a priori:u(p, f) = u^(inc)(p, f) + k²∫_(D)G(p, q, f) ⋅ χ(q) ⋅ u(q, f)⋅  𝕕v(q)

In a step similar to the above procedure, the relation is simplified byintroducing regions where the dielectric function is assumed to beconstant:${u_{j}\left( {p,f} \right)} = {{u^{inc}\left( {p,f} \right)} + {k^{2}{\sum\limits_{n = 1}^{N}\quad{\chi_{n} \cdot {\int_{D_{N}}{{G\left( {p,q,f} \right)} \cdot {u\left( {q,f} \right)} \cdot \quad{\mathbb{d}{v(q)}}}}}}}}$

where G denotes again the two-dimensional Green's function of theelectromagnetic problem${G\left( {p,q,f} \right)} = {\frac{\mathbb{i}}{4}{H_{0}^{(1)}\left( {k \cdot {{r - q}}} \right)}}$

and the polarisability χ_(n) depends on the dielectric function of thematerial ε being constant on the region D_(n) and the background ε_(b·).in the following way: $\chi_{n} = \frac{ɛ_{n} - ɛ_{b}}{ɛ_{0}}$

The wave vector k is defined to be the wave propagation constant in thebackground medium given by ε_(r,b),μ_(r,b):k=2πf√{square root over (ε ⁰ μ ⁰ ε _(r,b) μ _(r,b) )}

From the above a similar frequency dependent integral equation for thescattered electric field at any point r is set up.${F\left( {r,f} \right)} = {\frac{\mathbb{i}}{4}k^{2}{\sum\limits_{n = 1}^{N}\quad{\chi_{n} \cdot {\int_{D_{n}}{{H_{0}^{(1)}\left( {k \cdot {{r - q}}} \right)} \cdot \quad\left\lbrack {{F\left( {q,f} \right)} + {u^{inc}\left( {q,f} \right)}} \right\rbrack \cdot {\mathbb{d}{v(q)}}}}}}}$

For this relation a similar solution process as in the general case isapplied.

Below is described a calculation of the dielectric function for one pairof antennas for various frequencies for frequency dependentpolarisation.

A first order approximation for the frequency dependence of thepolarisation is obtained by grouping the measurement frequencies in twogroups, a group at lower and a group at higher frequencies. The abovesummarised calculation process is repeated twice and the difference inthe obtained polarisation values gives a measure for its frequencydependence.

In order to calculate the material parameters based on dielectric data,the relation between the material parameters as density, temperature andwater content is needed. For most applications the following model forthe temperature dependence of the dielectric function of water(extracted from experimental data published in IEEE Press 1995 by A.Kraszewski, with the title “Microwave Aquametry”) is: $\begin{matrix}{{ɛ_{H2O}(T)} = \frac{ɛ_{\infty}(T)}{1 + {\omega_{\tau}^{2}(T)}}} & (1)\end{matrix}$

An approach (based on a simple volumetric mixing relation yields thedielectric chart depicted in FIG. 5 where the real and imaginary partsof the dielectric function are taken as independent co-ordinates:ε(T,c _(H20) ,d)=(1−c _(H20))·ε_(basis) ·d+c_(H20)·(ε_(H20)(T)−ε_(basis) ·d)  (2)

Obviously every point in the complex dielectric plane stands for aunique water contents and material temperature when the dielectricproperties of the dried base material do not change considerably. Anunique density—temperature plot is obtained, when the water contents isuniform.

From the spatial distribution of the dielectric function of the materialsample 16, its density distribution moisture content and temperature arereadily obtained applying a water model (see equation 1) and a mixingrelation (see equation 2). This part of the evaluation is shownschematically in FIG. 5, a schematic view of the complete calculationprocess is given in FIG. 7.

The imaginary part of the dielectric constant Im(ε) forms a first axisin FIG. 5 and the real part of the dielectric constant Re(ε) forms asecond axis, perpendicular to the first axis. The real part is positiveand the imaginary part is negative. Any material without water contenthave a specific dielectric constant, so called ε_(dry), which varybetween point 50 and 51 depending on the material, both only having areal part. On the other hand, pure water having a temperature of 4° C.has a dielectric constant 52 comprising both a real part and animaginary part, and when the temperature of the water increase itfollows a curve 53 to a point where pure water has a temperature of 99°C. and a dielectric constant 54. The real part of the dielectricconstant for materials containing any amount of water decreases withhigher temperature and the imaginary part of the dielectric constant formaterials containing any amount of water increases with highertemperature. For illustration see the dashed lines in FIG. 5 for watercontent of 25, 50 and 75%.

An example of a dielectric value 55 is indicated in FIG. 5. The value 55is situated within a region 56 delimited by the curve 53, stretchingbetween point 52 and 54, a straight line between point 54 and ε_(dry)and a straight line between ε_(dry) and point 52. As mentioned before,if the temperature increase, with constant water content, the value ofthe dielectric constant 55 moves to the left in the graph as indicatedby the arrow 56, and if the temperature decrease, with constant watercontent, the value 55 moves to the right as indicated by the arrow 57.On the other hand, if the water content decrease, with constanttemperature, the value 55 moves towards ε_(dry) as indicated by thearrow 58, and if the water content increase, with constant temperature,the value 55 moves away from ε_(dry) as indicated by the arrow 59.

For each defined region 43 the calculated, or estimated, dielectricconstant may be directly transformed into water content and temperature.

FIG. 6 illustrates a measurement device 60 according to a secondembodiment of the present invention. This embodiment comprises the sameparts as the first embodiment described in connection with FIG. 1,except that the memory 15 is replaced with a video imaging arrangementcomprising two video cameras 61 and 62, both connected to an evaluationunit 63, which in turn is connected to the analyser 14.

Each video camera 61, 62 continuously take pictures of the materialsample 16. The pictures are sent to the evaluation unit 63, where athree dimensional picture is created using known techniques. Theresulting three dimensional picture similar to the one that was storedin the memory 15 in the first embodiment.

By using video imaging the system gets more flexible and it is possibleto use the measurement device on material samples having an unknownshape or even a changing shape depending the water content and/or thetemperature.

In the above evaluation the major reason to use video imaging is toreduce the number of unknowns in the calculation process to obtain thedielectric function's distribution in the material sample. The obtainedreduction in calculation time is necessary (at least in today'savailable calculation power) to speed up the measurement process. Inthis preferred embodiment, the material samples are easily accessible tovideo imaging. If this is not the case, alternative solutions areultrasound imaging. If the material samples have a simple geometric formor if subsequent material samples are very similar, no extra imaging isnecessary to perform the above calculation process as described in theFIG. 1.

The calculation of the dielectric image (of a two-dimensional crosssection) of the material sample in the measurement gap is accomplishedby solving the previously described inverse scattering problem.

Both video cameras 61 and 62 image the part of the measurement gap. Thelocation of the cameras 61 and 62 are chosen in a way to enable thereconstruction of a three-dimensional picture where the material sample16 is positioned within the measurement gap.

For each position of the material sample 16 a three-dimensional pictureof the sample location in the measurement gap is calculated based onimages taken by the video cameras 61 and 62.

In addition the position information contained in the optical image isused together with a priori knowledge of the material structure theobtain a first guess of the dielectric structure under measurement. Thisenables to reduce the number of unknowns of the dielectric imagingcalculation process drastically (about two orders of magnitude) and tospeed up the calculation considerably.

FIG. 7 show a schematic view of the complete calculation process for thedevice according to the invention.

As previously described in connection with FIG. 1 and FIG. 6, the inputdata to the analyser comprises the microwave transmission measurements,i.e. information regarding the emitted signals 18 (amplitude and phasefor each used frequency) and the detected signals 19 (amplitude andphase for the corresponding frequency). This information is input in thecalculation process, 71.

Information regarding the image contour of the material sample 16 isalso needed and inputted into the process, 72. A predeterminedresolution of the image contour is used to start the calculationprocess. The resolution may be increased or decreased dependent on thecalculation results, as described below. Information regarding theposition of the material sample 16 in the measurement gap is alsoinputted into the process in 72.

The information from 72 is used to establish an object geometry, 73. Amodel, for instance as described in FIG. 3, is thereafter used todetermine regions wherein the dielectric function is assumed of thefirst order, i.e. constant. The number of regions used is set in themodel. The selected model, in this case model 30, is used to establishregions in the material sample 16 by adjusting the concentric circles tothe result of the object geometry from 73, which is done in 74, asdescribed in FIG. 4.

The geometry assumptions from 74 and the result from the microwavetransmission measurement from 71, is thereafter used to calculate thedielectric constant within each region, 75. The calculation process havepreviously been described in this application.

Another piece of information is needed to convert the dielectricconstant into water content and/or temperature, that is the dielectricconstant for the material sample 16, when there is no water content inthe material, ε_(dry). This information may be obtained from literatureor from previously made measurements on similar material samples, 76.

This information is used to establish the equations defining therelation between the dielectric constant and the water content andtemperature, as described in connection with FIG. 5, 77.

The resulting dielectric constant within each region from 75 isthereafter translated (or converted) into water content and temperature,78.

If the calculation process is well established the following steps maybe unnecessary, but in most cases they are necessary to avoidunreasonable results.

In 79, a check is made to determine if the resulting temperature andwater contents are reasonable, i.e. the temperature is greater thanzero, T>0, the water content is greater than zero, C_(H2O)>0 (i.e.Im(ε)<0) and if the water content is less than 100%, C_(H2O)<100%.

If any of the above mentioned checks does not pass, the calculationprocess is fed back via 80, where the position of the material sample isupdated. If video cameras are used, as described in FIG. 6, a new imagecontour of the material sample is used to repeat the steps 74, 75 and78. In the case where the image contour information is previously storedin a memory, as described in FIG. 1, the calculation process may make asmall adjustment to the material size, deform the material contour,translate the material in one direction and the repeat steps 74, 75 and78.

If no objections are raised regarding reasonable results in 79 theprocess continue to 81, where the smoothness of the curve describing thedielectric function across the cross section of the material sample isinvestigated. If the dielectric function is too smooth or not enoughsmooth, the process is fed back via 82, where the resolution of theimage contour is changed. Thereafter the steps 73, 74, 75 and 78 arerepeated before the checks 79 and 81 are performed again.

There is also a possibility to change the number of regions in the usedmodel in 74 to increase or decrease the number of regions to calculate.

If the smoothness of the curve is acceptable, the process proceed to 83,where a new dry dielectric constant, ε_(dry), of the material iscalculated depending on the calculated results in the process. If thecalculated dry dielectric constant, ε_(dry), does not correspond withthe used dry dielectric constant, ε_(dry,prior), the dielectric constantis updated in 84 and the translation of the dielectric function in step76, 77 and 79 are repeated, before the checks 79, 81 and 83 areperformed again.

If no objections are raised in 83, the process presents the results inthe form of water content and or temperature at step 85.

The calculation process described in FIG. 7 is normally performed for aposition of the material sample in the measurement gap. When thecalculation process is completed the conveyor means 17, on which thematerial sample 16 is moved to a new position where another measurementis performed. The updated information, regarding, ε_(dry), number ofregions, position of material, and so on, are used at the next positionto speed up the process.

In a further embodiment of the present invention a multiple of receivingantennas may be used to allow a single processing, as described in FIG.7, to establish the three dimensional temperature, or water content,distribution within the material sample.

The calculation process in FIG. 7 only describe the embodiment where themodel is used to establish regions, where the dielectric constant isassumed constant.

1. A device for measuring a distribution of selected properties of amaterial, comprising: an emitter configured to emit electromagneticradiation at at least a first and second frequency in a selectedfrequency range through the material; at least one sensor configured todetect electromagnetic radiation transmitted through the material; andan analyzer configured to determine the distribution of selectedproperties based on the detected electromagnetic radiation at the atleast first and second frequency, wherein the distribution of theselected properties is unchanged between the emitted electromagneticradiation at the first and second frequencies.
 2. The device of claim 1,further comprising: an image device configured to create a threedimensional contour of the material.
 3. The device of claim 2, whereinthe image device detects an image of the material to generate thethree-dimensional contour of the material.
 4. The device of claim 3,wherein the image device detects a picture of the material based onreflected optical wavelengths.
 5. The device of claim 3, wherein theimage device comprises a plurality of video cameras or an ultrasoundimaging device.
 6. The device of claim 1, wherein the analyzerinterpolates previously measured results stored in a memory to calculatethe distribution of selected properties in the material.
 7. The deviceof claim 1, wherein the determined distribution of selected propertiesin the material is based on a calculated distribution of a dielectricfunction in the material.
 8. The device of claim 7, wherein the analyzerobtains a first set of solutions for the distribution of dielectricfunction for the detected electromagnetic radiation at the firstfrequency, obtains a second set of solutions for the distribution of thedielectric function for the detected electromagnetic radiation at thesecond frequency, compares the first and second set of solutions, andselects a final solution within the first and second set of solutionsthat have substantially a same dielectric distribution as being thecalculated distribution of the dielectric function in the material. 9.The device of claim 8, wherein the analyzer selects the final solutionby excluding solutions containing values of the dielectric functionoutside a predetermined interval of dielectric functions for thematerial.
 10. The device of claim 1, wherein the selected frequencyrange comprises microwave frequencies.
 11. The device of claim 1,wherein the electromagnetic radiation at the first and secondfrequencies are transmitted simultaneously through the object.
 12. Thedevice of claim 1, wherein the electromagnetic radiation includes atleast a third frequency.
 13. A method for measuring a distribution ofselected properties of a material, comprising: emitting electromagneticradiation at at least a first and second frequency in a selectedfrequency range through the material; detecting electromagneticradiation transmitted through the material; and determining thedistribution of selected properties based on the detectedelectromagnetic radiation at the at least first and second frequency,wherein the distribution of the selected properties is unchanged betweenthe emitted electromagnetic radiation at the first and secondfrequencies.
 14. The method of claim 13, further comprising: creating athree dimensional contour of the material.
 15. The method of claim 14,wherein the creating step detects an image of the material to generatethe three-dimensional contour of the material.
 16. The method of claim15, wherein the creating step detects a picture of the material based onreflected optical wavelengths.
 17. The method of claim 15, wherein thecreating step uses a plurality of video cameras or an ultrasound imagingdevice.
 18. The method of claim 13, wherein the determining stepinterpolates previously measured results stored in a memory to calculatethe distribution of selected properties in the material.
 19. The methodof claim 13, wherein the determined distribution of selected propertiesin the material is based on a calculated distribution of a dielectricfunction in the material.
 20. The method of claim 19, wherein thedetermining step obtains a first set of solutions for the distributionof dielectric function for the detected electromagnetic radiation at thefirst frequency, obtains a second set of solutions for the distributionof the dielectric function for the detected electromagnetic radiation atthe second frequency, compares the first and second set of solutions,and selects a final solution within the first and second set ofsolutions that have substantially a same dielectric distribution asbeing the calculated distribution of the dielectric function in thematerial.
 21. The method of claim 20, wherein the determining stepselects the final solution by excluding solutions containing values ofthe dielectric function outside a predetermined interval of dielectricfunctions for the material.
 22. The method of claim 13, wherein theselected frequency range comprises microwave frequencies.
 23. The methodof claim 13, wherein the electromagnetic radiation at the first andsecond frequencies are transmitted simultaneously through the object.24. The method of claim 13, wherein the electromagnetic radiationincludes at least a third frequency.
 25. A computer program productconfigured to execute computer instructions for measuring a distributionof selected properties of a material, comprising: a first computer codeconfigured to determine the distribution of selected properties based ondetected electromagnetic radiation emitted through the material at atleast a first and second frequency, wherein the distribution of theselected properties is unchanged between the emitted electromagneticradiation at the first and second frequencies.
 26. The computer programproduct of claim 25, further comprising: a second computer codeconfigured to create a three dimensional contour of the material. 27.The computer program product of claim 26, wherein the second computercode detects an image of the material to generate the three-dimensionalcontour of the material.
 28. The computer program product of claim 27,wherein the second computer code detects a picture of the material basedon reflected optical wavelengths.
 29. The computer program product ofclaim 27, wherein the second computer code controls a plurality of videocameras or an ultrasound imaging device to detect the image.
 30. Thecomputer program product of claim 25, wherein the first computer codeinterpolates previously measured results stored in a memory to calculatethe distribution of selected properties in the material.
 31. Thecomputer program product of claim 25, wherein the determineddistribution of selected properties in the material is based on acalculated distribution of a dielectric function in the material. 32.The computer program product of claim 31, wherein the first computercode obtains a first set of solutions for the distribution of dielectricfunction for the detected electromagnetic radiation at the firstfrequency, obtains a second set of solutions for the distribution of thedielectric function for the detected electromagnetic radiation at thesecond frequency, compares the first and second set of solutions, andselects a final solution within the first and second set of solutionsthat have substantially a same dielectric distribution as being thecalculated distribution of the dielectric function in the material. 33.The computer program product of claim 32, wherein the first computercode selects the final solution by excluding solutions containing valuesof the dielectric function outside a predetermined interval ofdielectric functions for the material.
 34. The computer program productof claim 25, wherein the selected frequency range comprises microwavefrequencies.
 35. The computer program product of claim 25, wherein theelectromagnetic radiation at the first and second frequencies aretransmitted simultaneously through the object.
 36. The computer programproduct of claim 25, wherein the electromagnetic radiation includes atleast a third frequency.